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2007 : Design Approaches for Radiation Hardening in Digital Circuits

Author(s)
Oliver Höftberger
Abstract
Digital circuits exposed to radiation suffer from Single Event Upsets (SEUs) and even permanent damage. This is especially crucial for highly reliable systems, but also standard mircoelectronics exhibit more and more upsets. To prevent a system from failing, different radiation hardening techniques can be applied. Such methods can operate at differing levels of abstraction, begining from process technology up to system-level hardening concepts. Usually more than one mechanism is used for full radiation immunity, where a low level technique can protect a system against permanent faults and a higher level is used to mitigate transient errors. By selecting the radiation hardening concept carefully, a lot of overhead in area, time and power can be saved.
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