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7/2008 : Exploring the Usefulness of the Gate-level Stuck-at Fault Model for Muller C-Elements

RR Number
7/2008
Conference
Workshop Testmethoden und Zuverlässigkeit von Schaltungen und Systemen 2008
Author(s)
Julian Grahsl, Thomas Handl, Andreas Steininger
Abstract
The stuck-at fault model has proven extremely efficient for test vector generation in the combinational logic portions of synchronous circuits. Comparatively little, however, is known about its usefulness for testing asynchronous circuits. In this paper we will investigate this point at the example of the Muller C-element, a basic building block in asynchronous designs. Using fault simulation on the circuit level we will determine the coverage of test vector sets that have been derived based on the stuck-at model. We will identify uncovered faults and analyze their origin.
Bibtex
@article{ grahsl:2008-7,
  author =       "Julian Grahsl and Thomas Handl and Andreas Steininger",
  title =        "Exploring the Usefulness of the Gate-level Stuck-at Fault Model for Muller C-Elements",
  journal =      "Workshop Testmethoden und Zuverlässigkeit von Schaltungen und Systemen 2008",
  year =         "2008",
  month =        "Feb."
}
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