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37/2010 : Test-Case Generation for Embedded Binary Code Using Abstract Interpretation

RR Number
37/2010
Conference
Workshop on Mathematical and Engineering Methods in Computer Science (MEMICS 2010)
Author(s)
Thomas Reinbacher, Jrg Brauer, Martin Horauer, Andreas Steininger, Stefan Kowalewski
Abstract
This paper describes a framework for test-case generation for microcontroller binary programs using abstract interpretation techniques. The key idea of our approach is to derive program invariants a priori, and then use backward analysis to obtain test vectors that are executed on the target microcontroller. Due to the structure of binary code, the abstract interpretation framework is based on propositional encodings of the program semantics and SAT solving.
Bibtex
@article{ reinbacher:2010-37,
  author =       "Thomas Reinbacher and Jörg Brauer and Martin Horauer and Andreas Steininger and Stefan Kowalewski",
  title =        "Test-Case Generation for Embedded Binary Code Using Abstract Interpretation",
  journal =      "Workshop on Mathematical and Engineering Methods in Computer Science (MEMICS 2010)",
  year =         "2010",
  month =        "Oct."
}
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