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3/2012 : Efficient Radiation-Hardening of a Muller C-Element

RR Number
3/2012
Conference
2012 Single Event Effects Symposium (SEE 2012)
Author(s)
Varadan Savulimedu Veeravalli, Andreas Steininger
Abstract
The main theme of this paper is to present an efficient radiation tolerant Muller C-Element (MCE). We are at present designing an ASIC to experimentally investigate single event transients (SETs) in different types of combinational (NAND/NOR tree, XNOR tree, Inverter chain, etc.) and sequential (Flip-Flop chains, etc.) circuits. For measuring the length of SETs, SET sensitivity and SET propagation we need an on-chip infrastructure (reference and error counters) to capture and preprocess the data before transferring them to a host computer. This infrastructure will be exposed to the same radiation sources as the target circuits; therefore it needs to be radiation tolerant. As a part of infrastructure we employ Up/Down Counters built with MCEs, hence the analysis.
Bibtex
@inproceedings{ savulimedu veeravalli:2012-3,
  author =       "Varadan Savulimedu Veeravalli and Andreas Steininger",
  title =        "Efficient Radiation-Hardening of a Muller C-Element",
  journal =      "2012 Single Event Effects Symposium",
  year =         "2012",
  month =        "Apr."
}
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