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15/2012 : Pulse Shape Measurements by On-chip Sense Amplifiers of Single Event Transients Propagating through a 90 nm Bulk CMOS Inverter Chain

RR Number
15/2012
Comment
Abstract for late news poster presentation
Conference
2012 IEEE Nuclear and Space Radiation Effects Conference (NSREC)
Author(s)
Michael Hofbauer, Kurt Schweiger, Horst Dietrich, Horst Zimmermann, Kay-Obbe Voss, Bruno Merk, Ulrich Schmid, Andreas Steininger
Abstract
Single event transient (SET) pulse shapes caused by Au ions with 946 MeV were measured by using on-chip sense amplifiers. The propagation of these pulses through a 90 nm CMOS inverter chain was investigated.
Bibtex
@misc{HSDZ12:NSREC,
  author =       "Michael Hofbauer and Kurt Schweiger and Horst Dietrich and Horst Zimmermann and Kay-Obbe Voss and Bruno Merk and Ulrich Schmid and Andreas Steininger",
  title =        "Pulse Shape Measurements by On-chip Sense Amplifiers of Single Event Transients Propagating through a 90 nm Bulk {CMOS} Inverter Chain",
  text =      "Poster at IEEE Nuclear and Space Radiation Effects Conference (NSREC'12), Miami (USA)",
  year =         "2012",
}
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