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30/2012 : Towards an Accurate Characterization of Single-Event Transients in Digital Circuits

RR Number
30/2012
Comment
submitted
Conference
Journal
Author(s)
Varadan Savulimedu Veeravalli, Thomas Polzer, Ulrich Schmid, Andreas Steininger, Michael Hofbauer, Kurt Schweiger, Horst Dietrich, Kerstin Schneider-Hornstein, Horst Zimmermann, Kay-Obbe Voss, Bruno Merk, Michael Hajek
Abstract
We present the architecture and a detailed prefabrication analysis of a digital measurement ASIC facilitating long-term irradiation experiments of basic asynchronous circuits, which also demonstrates the suitability of our general approach for obtaining accurate radiation failure models as developed in our FATAL project. Our ASIC design combines radiation targets like Muller C-elements and elastic pipelines as well as standard combinational gates and flip-flops with an elaborate onchip measurement infrastructure. Major architectural challenges result from the fact that the latter must operate reliably under the same radiation conditions the target circuits are exposed to, without wasting precious die area for a rad-hard design. A measurement architecture based on multiple non-rad-hard counters is used, which we show to be resilient against double faults, as well as many triple and even higher-multiplicity faults. The design evaluation is done by means of comprehensive fault injection experiments, which are based on detailed Spice models of the target circuits in conjunction with a standard doubleexponential current injection model for single-event transients (SET). To be as accurate as possible, the parameters of this current model have been aligned with results obtained from 3D device simulation models, which have in turn been validated and calibrated using micro-beam radiation experiments at the GSI in Darmstadt, Germany. For the latter, target circuits instrumented with high-speed sense amplifiers have been used for analog SET recording. Together with a probabilistic analysis of the sustainable particle flow rates, based on a detailed area analysis and experimental cross-section data, we can conclude that the proposed architecture will indeed sustain significant target hit rates, without exceeding the resilience bound of the measurement infrastructure.
Bibtex
@techreport{ savulimedu veeravalli:2012-30,
  author =       "Varadan Savulimedu Veeravalli and Thomas Polzer and Ulrich Schmid and Andreas Steininger and Michael Hofbauer and Kurt Schweiger and Horst Dietrich and Kerstin Schneider-Hornstein and Horst Zimmermann and Kay-Obbe Voss and Bruno Merk and Stefan Hajek",
  title =        "Towards an Accurate Characterization of Single-Event Transients in Digital Circuits",
  institution =  "Technische Universit{\"a}t Wien, Institut f{\"u}r Technische Informatik",
  address =      "Treitlstr. 1-3/182-1, 1040 Vienna, Austria",
  type =         "Research Report",
  year =         "2012",
  number =       "30/2012"
}
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