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57/2012 : Single Event Effect Measurements in 90 nm CMOS Circuits at the Microbeam Facility for the Project FATAL

RR Number
57/2012
Conference
GSI Scientific Report 2011, GSI Helmholtzzentrum fr Schwerionenforschung GmbH, Darmstadt, p. 424, 2012, ISSN: 0174-0814
Author(s)
Michael Hofbauer, Kurt Schweiger, Horst Dietrich, Horst Zimmermann, Ulrich Schmid, Bruno Merk, Kay-Obbe Voss
Bibtex
@inproceedings{HSDZ12:GSI,
  author =       "Michael Hofbauer and Kurt Schweiger and Horst Dietrich and Horst Zimmermann and Ulrich Schmid and Bruno Merk",
  title =        "Single Event Effect Measurements in 90nm {CMOS} Circuits at the Microbeam Facility for the Project {FATAL}",
  booktitle =      "GSI Scientific Report 2011",
  year =         "2012",
  isbn =        " 0174-0814",
  pages= "424",
  address = "GSI Helmholtzzentrum für Schwerionenforschung GmbH, Darmstadt, Germany",
}
Download
Get GSI_Report_PNI-MR-26.pdf - Adobe PDF-format, (219.4502 KB; posted at July 09 2013)

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