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62/2012 : Pulse Shape Measurements by On-chip Sense Amplifiers of Single Event Transients Propagating through a 90 nm Bulk {CMOS} Inverter Chain

RR Number
62/2012
Conference
IEEE Transactions on Nuclear Science 59(6): 2778-2784, 2012
Author(s)
Michael Hofbauer, Kurt Schweiger, Horst Dietrich, Horst Zimmermann, Kay-Obbe Voss, Bruno Merk, Ulrich Schmid, Andreas Steininger
Abstract
Single event transient (SET) pulse shapes caused by Au ions with 946 MeV were measured at the microprobe facility at the GSI in Darmstadt. Using on-chip sense amplifiers, our novel approach allows observing SET pulse shapes at any interesting circuit node with negligible distortion. We were hence able to accurately trace the propagation of SET pulses through a 90 nm CMOS inverter chain.
Bibtex
@article{HSDZ12:ToNS,
  author =       "Michael Hofbauer and Kurt Schweiger and Horst Dietrich and Horst Zimmermann and Kay-Obbe Voss and Bruno Merk and Ulrich Schmid and Andreas Steininger",
  title =        "Pulse Shape Measurements by On-chip Sense Amplifiers of Single Event Transients Propagating through a 90 nm Bulk {CMOS} Inverter Chain",
  journal =      "IEEE Transactions on Nuclear Science",
  year =         "2012",
  month = dec,
  volume = 59,
  number = 6,
  pages = 2778-2784,
}
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